DEPFET based focal plane instrumentation for X-ray imaging spectroscopy in space

IEEE Nuclear Science Symposium Conference Record

Volumn 3, Issue , 2007, Pages 2226-2235

  Treis, J ^a   Andricek, L ^b   Herrmann, S ^a   Heinzinger, K ^c   Lauf, T ^a   Lechner, P ^c   Lutz, G ^c   Mas Hesse, J M ^e   Porro, M ^a   Richter, R H ^b   Schaller, G ^a   Schnecke, M ^b   Schopper, F ^a   Segneri, G ^c   Soltau, H ^c   Stevenson, T ^d   Struder L ^a   Whitford, C ^d   Wolfel S ^a  

^a MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^b MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

^c PNSENSOR GMBH   (Germany)

^d UNIVERSITY OF LEICESTER   (United Kingdom)

^e CSIC   (Spain)

Author keywords

Active pixel sensor; BepiColombo; DEPFET; Imaging spectroscopy; Macropixel; Silicon drift detector; SIMBOL X; X ray; XEUS

Indexed keywords

ASTRONOMICAL SATELLITES; ASTRONOMY; ASTROPHYSICS; DETECTORS; FOCUSING; HIGH ENERGY PHYSICS; IMAGE SENSORS; INSTRUMENTS; MERCURY (METAL); METAL DETECTORS; PIXELS; QUANTUM EFFICIENCY; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR QUANTUM DOTS; SENSORS; SPACECRAFT OBSERVATORIES; X RAY ANALYSIS; X RAYS;

ACTIVE PIXEL SENSOR; BEPICOLOMBO; DEPFET; IMAGING SPECTROSCOPY; MACROPIXEL; SILICON DRIFT DETECTOR; SIMBOL-X; X-RAY; XEUS;

MEDICAL IMAGING;

EID: 42149091249     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2007.4436593     Document Type: Conference Paper

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