DEPFET detector-amplifier structure: Properties, achievements and new developments, concepts and applications

IEEE Nuclear Science Symposium Conference Record

Volumn 2, Issue , 2007, Pages 988-994

  Lutz, Gerhard ^a,d   Herrmann, Sven ^b,d   Lechner, Peter ^a,d   Porro, Matteo ^b,d   Richter, Rainer H ^c,d   Strüder, Lothar ^b,d   Treis, Johannes ^b,d   Wölfel, Stefan ^b,d  

^a PNSENSOR GMBH   (Germany)

^b MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^c MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

^d MPI HALBLEITERLABOR   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ASTRONOMY MISSIONS; BUILDING BLOCKS; CHARGE MEASUREMENTS; COMMON PROPERTIES; DYNAMIC RANGES; ELEMENTARY CHARGES; FREE ELECTRONS; HIGH QUALITIES; HIGH RESOLUTIONS; NEW CONCEPTS; NEW DEVELOPMENTS; NON-LINEAR DEVICES; PIXEL DETECTORS; SEMICONDUCTOR PIXELS; SIGNAL CHARGES; SILICON PROCESSING; SIMULTANEOUS MEASUREMENTS; TIME INTERVALS;

APPLICATIONS; DETECTORS; ELECTRIC CONDUCTIVITY; FREE ELECTRON LASERS; LASERS; LIGHT; MEDICAL IMAGING; PIXELS; READOUT SYSTEMS; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR MATERIALS; SILICON DETECTORS;

SEMICONDUCTOR DETECTORS;

EID: 48349111022     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2007.4437181     Document Type: Conference Paper

References (2)

1. J. Kemmer and G. Lutz, "New semiconductor detector concepts", Nucl. Instr. Meth. A253 (1987) 356-377
2. S. Wölfel, S. Herrmann, P. Lechner, G. Lutz, M. Porro, R.H. Richter, L. Strüder, J. Treis, "Sub electron noise measurements on repetitive non-destructive readout devices," Nucl. Instr. & Meth. A566 (2006) 536-539