Origin of electrically heterogeneous microstructure in CuO from scanning tunneling spectroscopy study

Applied Physics Letters

Volumn 92, Issue 14, 2008, Pages

  Sarkar, Sudipta ^a   Jana, Pradip Kumar ^a   Chaudhuri, B K ^a,b  

^a DEPARTMENT OF MATERIALS SCIENCE   (India)

^b NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; GRAIN BOUNDARIES; MICROSTRUCTURE; PERMITTIVITY; SCANNING TUNNELING MICROSCOPY;

BARRIER LAYER; CUO GRAINS; ELECTRICALLY INHOMOGENEOUS MICROSTRUCTURE; INSULATING BEHAVIOR;

COPPER OXIDES;

EID: 42149090548     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2907700     Document Type: Article

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