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Volumn 88, Issue 7, 2006, Pages

Direct current bias effects on grain boundary Schottky barriers in CaCu 3Ti 4O 12

Author keywords

[No Author keywords available]

Indexed keywords

CONTROLLED MOBILITY; ELECTRICAL PROPERTIES; GRAIN BOUNDARY RESISTANCE; GRAIN CONDUCTIVITY;

EID: 32944465088     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2172739     Document Type: Article
Times cited : (73)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.