Studies on the optical properties and surface morphology of cobalt phthalocyanine thin films

E-Journal of Chemistry

Volumn 5, Issue 1, 2008, Pages 86-92

  Joseph, Benny ^a   Menon, C S ^a  

^a MAHATMA GANDHI UNIVERSITY   (India)

Author keywords

Cobalt Phthalocyanine; Scanning electron micrograph; Thermal evaporation; Thin film; X ray diffraction

Indexed keywords

EID: 42049119132     PISSN: None     EISSN: 09734945     Source Type: Journal    
DOI: 10.1155/2008/102948     Document Type: Article

References (25)

1. Kivits P. J, de Bont M. R. J and Van der Veen J. Appl. Phys., 1981, 36, 101.
2. Burgess A. N, J. Appl. Phys., 1987, 61, 74.
3. Wright J. D, Prog. Surf. Sci., 1989, 31, 1.
4. Herrera M, Gonzalez D, Hopkinson M and Navaretti P, J. Semicond. Sci. Technol. 2004, 19, 813.
5. Jones T. A. and Bott B, Sens. Actuat., 1986, 9, 27.
6. Narayanan Unni K.N and Menon C.S, Materials Letters, 2000, 45, 326.
7. Gargi Agarwal and Reddy G. B, J. Materials Science: Materials in Electronics, 2005, 16, 21.
8. Anderson J S, Bradbrook E.F, Cook A.H and Linstead R P, J. Chem. soc., 1938, Part II, 1151.
9. Yamashita A, Maruno Tand Hayami T, J. Phys. Chem., 1993, 97, 4567.
10. Jungyoon E, Sunmi Kim, Eunju Lim, Kiejin Lee, Deokjoon Cha and Barry Friedman, Applied Surface Science, 2003, 205, 274.
11. Djurisic A B, Kwong C Y, Lau T W, Guo W L, Li E.H, Liu Z.T, H.S Kwok, Lam L.S.M and Chan W.K, Optics Communicatioms, 2002, 205,155.
12. Xia H and Nogami M, Opt. Mater., 2000, 15, 93.
13. Lucia E A and Veraerame E. D, J. Chem. Phys., 1968, 48, 2674.
14. Barrett M A, Borkowska Z, Humphreys M W and Parsons R, Thin Solid Films, 1975, 28, 289.
15. Raji P, Sanjeeviraja C and Ramachandran K, Bull. Matter. Sci., 2005, 28, 233.
16. Yuh-Lang Lee, Wen-Ching Tsai, and Jer-Ru Maa, Applied surface science, 2001, 173, 352.
17. Fostoss-Wegner M, Themochimica Acta, 1978, 23, 93.
18. Allen Twarowski, J. Chem. Phys., 1982, 77, 4698.
19. Robinson M.T and G.E. Klein, J. Amer. Chem. Soc., 1952, 74, 6294.
20. Rout S K, Panigrahi S and Bera J, J. bull. Matter, 2005, 28, 275.
21. Hu X.J, Li R. B, Shen H. S, Dai Y B and He X. C, Carbon, 2004, 42, 1501.
22. Campbell D and Collins R. A, Phys. Stat. Sol. (a), 1995, 152, 431.
23. Hisao Yanagi, Takashi Kouzeki and Michio Ashda, J. Appl. Phys., 1992, 71, 5146.
24. Dogo S, Germain J. P, Maleysson C and Pauly A, Thin Solid Films, 1992, 219, 244.
25. Shihub S. I. and Gould R.D, Thin Solid Films, 1995, 254, 187.