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physica status solidi (a)

Volumn 152, Issue 2, 1995, Pages 431-442

The effect of surface topography on the sensitivity of lead phthalocyanine thin films to nitrogen dioxide

(2) Campbell, D a Collins, R A a

a LANCASTER UNIVERSITY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; LIGHT ABSORPTION; NITROGEN COMPOUNDS; OPTICAL MICROSCOPY; QUARTZ; RECOVERY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING LEAD COMPOUNDS; SURFACE PROPERTIES; THERMAL EFFECTS; X RAY DIFFRACTION;

GAS SENSITIVITY; LEAD PHTHALOCYANINE; MONOCLINIC PHASE; NITROGEN DIOXIDE; OPTICAL ABSORPTION MICROSCOPY; SURFACE TOPOGRAPHY; TRICLINIC PHASE;

THIN FILMS;

EID: 0029510014 PISSN: 00318965 EISSN: 1521396X Source Type: Journal
DOI: 10.1002/pssa.2211520211 Document Type: Article

Times cited : (12)

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