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Volumn 43, Issue 4, 2008, Pages 842-861

Comparison of cleanroom samplers for inorganic airborne molecular contaminants

Author keywords

Airborne molecular contamination (AMC); Cleanroom; Diffusion denuder sampler (DDS); Impinger air sampler; Micro contamination; Semiconductor device

Indexed keywords

CONCENTRATION (PROCESS); MOLECULAR STRUCTURE; SEMICONDUCTOR DEVICES; SILICA GEL;

EID: 41849148300     PISSN: 01496395     EISSN: 15205754     Source Type: Journal    
DOI: 10.1080/01496390701870580     Document Type: Article
Times cited : (12)

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