-
1
-
-
0003615349
-
-
Technology Transfer #95 052 812A-TR SEMATECH
-
Kinkead, D., Joffe, M., Higley, J., and Kishkovich, O. ( 1995) Forecast of Airborne Molecular Contamination Limits for the 0.25 Micron High Performance Logic Process. In Technology Transfer #95 052 812A-TR SEMATECH.
-
(1995)
Forecast of Airborne Molecular Contamination Limits for the 0.25 Micron High Performance Logic Process
-
-
Kinkead, D.1
Joffe, M.2
Higley, J.3
Kishkovich, O.4
-
2
-
-
0032063845
-
Impact of organic contaminants from the environment on electrical characteristics of thin gate oxides
-
Ogata, T., Ban, C., Ueyama, A., Muranaka, S., Hayashi, T., Kobayashi, K., Kobayashi, J., Kurokawa, H., Ohno, Y., and Hirayama, M. (1998) Impact of organic contaminants from the environment on electrical characteristics of thin gate oxides. Jpn. J. Appl. Phys., 37: 2468.
-
(1998)
Jpn. J. Appl. Phys
, vol.37
, pp. 2468
-
-
Ogata, T.1
Ban, C.2
Ueyama, A.3
Muranaka, S.4
Hayashi, T.5
Kobayashi, K.6
Kobayashi, J.7
Kurokawa, H.8
Ohno, Y.9
Hirayama, M.10
-
3
-
-
0032154614
-
Impact of organic contamination on thin gate oxide quality
-
De Gendt, S., Knotter, D.M., Kenis, K., Depas, M., Meuris, M., Mertens, P.W., and Heyns, M.M. (1998) Impact of organic contamination on thin gate oxide quality. Jpn. J. Appl. Phys., 37: 4649.
-
(1998)
Jpn. J. Appl. Phys
, vol.37
, pp. 4649
-
-
De Gendt, S.1
Knotter, D.M.2
Kenis, K.3
Depas, M.4
Meuris, M.5
Mertens, P.W.6
Heyns, M.M.7
-
5
-
-
0029541012
-
The effect of airborne contaminants in the cleanroom for ULSI manufacturing process
-
Tamaoki, M., Nishiki, K., Shimazaki, A., Sasaki, Y., and Yanagi, S. (1995) The effect of airborne contaminants in the cleanroom for ULSI manufacturing process. IEEE /SEMI Advanced Semiconduct. Manufact. Conf., 322.
-
(1995)
IEEE /SEMI Advanced Semiconduct. Manufact. Conf
-
-
Tamaoki, M.1
Nishiki, K.2
Shimazaki, A.3
Sasaki, Y.4
Yanagi, S.5
-
6
-
-
17144441256
-
-
Kinkead, D. (1999) The value of airborne base contamination measurement in DUV lithography. Microlithography World, 22.
-
Kinkead, D. (1999) The value of airborne base contamination measurement in DUV lithography. Microlithography World, 22.
-
-
-
-
7
-
-
0000426917
-
Airborne contamination of a chemically amplified resist. I. Identification of problem
-
MacDonald, S.A., Hinsberg, W.D., Wendt, H.R., Clecak, N.J., and Willson, C.G. (1993) Airborne contamination of a chemically amplified resist. I. Identification of problem. Chem. Mater., 5: 348.
-
(1993)
Chem. Mater
, vol.5
, pp. 348
-
-
MacDonald, S.A.1
Hinsberg, W.D.2
Wendt, H.R.3
Clecak, N.J.4
Willson, C.G.5
-
8
-
-
2642558705
-
The removal of airborne molecular contamination in cleanroom using PTFE and chemical filters
-
Yeh, C.F., Hsiao, C.W., Lin, S.J., Hsieh, C.M., Kusumi, T., Aomi, H., Kaneko, H., Dai, B.T., and Tsai, M.S. (2004) The removal of airborne molecular contamination in cleanroom using PTFE and chemical filters. IEEE Trans. Semiconduct. Manufact., 17: 214.
-
(2004)
IEEE Trans. Semiconduct. Manufact
, vol.17
, pp. 214
-
-
Yeh, C.F.1
Hsiao, C.W.2
Lin, S.J.3
Hsieh, C.M.4
Kusumi, T.5
Aomi, H.6
Kaneko, H.7
Dai, B.T.8
Tsai, M.S.9
-
9
-
-
0034313440
-
Reducing airborne molecular contamination by efficient purging of FOUPs for 300-mm wafers-The influence of materials properties
-
Frickinger, J., Bugler, J., Zielonka, G., Pfitzner, L., Ryssel, H., Hollemann, S., and Schneider, H. (2000) Reducing airborne molecular contamination by efficient purging of FOUPs for 300-mm wafers-The influence of materials properties. IEEE Trans. Semiconduct. Manufact., 13: 427.
-
(2000)
IEEE Trans. Semiconduct. Manufact
, vol.13
, pp. 427
-
-
Frickinger, J.1
Bugler, J.2
Zielonka, G.3
Pfitzner, L.4
Ryssel, H.5
Hollemann, S.6
Schneider, H.7
-
10
-
-
41849123816
-
-
SEMI Standard F21.-95, (1996) Classification of Airborne Molecular Contaminant Levels in Clean Environments, SEMI, Mountain View, C.A., U.S.A.
-
SEMI Standard F21.-95, (1996) Classification of Airborne Molecular Contaminant Levels in Clean Environments, SEMI, Mountain View, C.A., U.S.A.
-
-
-
-
11
-
-
0032562806
-
Application of ion chromatography to the semiconductor industry. I. Measurement of acidic airborne contaminants in cleanrooms
-
Lue, S.J., Wu, T., Hsu, H., and Huang, C. (1998) Application of ion chromatography to the semiconductor industry. I. Measurement of acidic airborne contaminants in cleanrooms. J. Chromatogr. A., 804: 273.
-
(1998)
J. Chromatogr. A
, vol.804
, pp. 273
-
-
Lue, S.J.1
Wu, T.2
Hsu, H.3
Huang, C.4
-
12
-
-
0032797890
-
Applications of ion chromatography in the semiconductor industry. II. Determination of basic airborne contaminants in a cleanroom
-
Lue, S.J. and Huang, C. (1999) Applications of ion chromatography in the semiconductor industry. II. Determination of basic airborne contaminants in a cleanroom. J. Chromatogr. A., 850: 283.
-
(1999)
J. Chromatogr. A
, vol.850
, pp. 283
-
-
Lue, S.J.1
Huang, C.2
-
13
-
-
0034968367
-
Application of ion chromatography in the semiconductor industry
-
Vanatta, L.E. (2001) Application of ion chromatography in the semiconductor industry. Trends Anal. Chem., 20: 336.
-
(2001)
Trends Anal. Chem
, vol.20
, pp. 336
-
-
Vanatta, L.E.1
-
14
-
-
0022591446
-
Laboratory evaluation of silica gel sorbent tubes for sampling hydrogen fluoride
-
Cassinelli, M.E. (1986) Laboratory evaluation of silica gel sorbent tubes for sampling hydrogen fluoride. Am. Ind. Hyg. Assoc. J., 47: 219.
-
(1986)
Am. Ind. Hyg. Assoc. J
, vol.47
, pp. 219
-
-
Cassinelli, M.E.1
-
15
-
-
41849092953
-
Impact of airborne molecular contamination to nano-device performance
-
Yeh, C.F., Hsiao, C.W., Lin, S.J., Xie, Z.M., Kusumi, T., Aomi, H., Kaneko, H., Da, B.T., and Tsai, M.S. (2002) Impact of airborne molecular contamination to nano-device performance. IEEE-Nano, 461.
-
(2002)
IEEE-Nano
, pp. 461
-
-
Yeh, C.F.1
Hsiao, C.W.2
Lin, S.J.3
Xie, Z.M.4
Kusumi, T.5
Aomi, H.6
Kaneko, H.7
Da, B.T.8
Tsai, M.S.9
-
16
-
-
41849125951
-
-
Taiwan Institute of Occupational Safety and Health, 1st edn, Institute of Occupational Safety and Health, Taiwan, TIOSH in Chinese
-
Taiwan Institute of Occupational Safety and Health, (1994) TIOSH Manual of Analytical Methods, No. 2401, 1st edn.; Institute of Occupational Safety and Health, Taiwan, TIOSH (in Chinese).
-
(1994)
TIOSH Manual of Analytical Methods, No. 2401
-
-
-
17
-
-
0031127135
-
Effect of impaction, bounce and reaerosolization on the collection efficiency of impingers
-
Grinshpun, S.A., Willeke, K., Ulevicius, V., Juozaitis, A., Terzieva, S., Donnelly, J., Stelma, G.N., and Brenner, K.P. (1997) Effect of impaction, bounce and reaerosolization on the collection efficiency of impingers. Aerosol Sci. Technol., 26: 326.
-
(1997)
Aerosol Sci. Technol
, vol.26
, pp. 326
-
-
Grinshpun, S.A.1
Willeke, K.2
Ulevicius, V.3
Juozaitis, A.4
Terzieva, S.5
Donnelly, J.6
Stelma, G.N.7
Brenner, K.P.8
-
18
-
-
0038540211
-
Condenser-type diffusion denuders for the collection of sulfur dioxide in a cleanroom
-
Chang, I.H., Lee, D.S., and Ock, S.H. (2003) Condenser-type diffusion denuders for the collection of sulfur dioxide in a cleanroom. Anal. Bioanal. Chem., 375:456.
-
(2003)
Anal. Bioanal. Chem
, vol.375
, pp. 456
-
-
Chang, I.H.1
Lee, D.S.2
Ock, S.H.3
-
19
-
-
1642475492
-
Trends in atmospheric trace gas measurement instruments with membrane-based gas diffusion scrubbers
-
Toda, K. (2004) Trends in atmospheric trace gas measurement instruments with membrane-based gas diffusion scrubbers. Anal. Sci., 20: 19.
-
(2004)
Anal. Sci
, vol.20
, pp. 19
-
-
Toda, K.1
-
20
-
-
0028464059
-
A compact porousmetal denuder for atmospheric sampling of inorganic aerosols
-
Poon, W.S., Pui, D.Y.H., Lee, C.T., and Liu, B.Y.H. (1994) A compact porousmetal denuder for atmospheric sampling of inorganic aerosols. J. Aerosol Sci., 25: 923.
-
(1994)
J. Aerosol Sci
, vol.25
, pp. 923
-
-
Poon, W.S.1
Pui, D.Y.H.2
Lee, C.T.3
Liu, B.Y.H.4
-
21
-
-
0024215801
-
Evaluation of annular denuder/filter pack system to collect acidic aerosols and gases
-
Koutrakis, P., Wolfson, J.M., Slater, J.L., Brauer, M., and Spengler, J.D. (1988) Evaluation of annular denuder/filter pack system to collect acidic aerosols and gases. Environ. Sci. Technol., 22: 1463.
-
(1988)
Environ. Sci. Technol
, vol.22
, pp. 1463
-
-
Koutrakis, P.1
Wolfson, J.M.2
Slater, J.L.3
Brauer, M.4
Spengler, J.D.5
-
22
-
-
0024856022
-
Comparison of annular denuders and filter packs for atmospheric sampling
-
Dasch, J.M., Cadle, S.H., Kennedy, K.G., and Mulawa, P.A. (1989) Comparison of annular denuders and filter packs for atmospheric sampling. Atmos. Environ., 23: 2775.
-
(1989)
Atmos. Environ
, vol.23
, pp. 2775
-
-
Dasch, J.M.1
Cadle, S.H.2
Kennedy, K.G.3
Mulawa, P.A.4
-
23
-
-
0023104759
-
Nitric acid-nitrate aerosol measurements by a diffusion denuder, a performance evaluation
-
Durham, J.L, Spiller, L.L., and Ellestad, T.G. (1987) Nitric acid-nitrate aerosol measurements by a diffusion denuder, a performance evaluation. Atmos. Environ., 21: 589.
-
(1987)
Atmos. Environ
, vol.21
, pp. 589
-
-
Durham, J.L.1
Spiller, L.L.2
Ellestad, T.G.3
-
25
-
-
41849093321
-
NIOSH Manual of Analytical Methods, No. 7903
-
National Institute for Occupational Safety and Health
-
National Institute for Occupational Safety and Health, (1994) NIOSH Manual of Analytical Methods, No. 7903, 4th (edn.); Cincinnati, O.H.
-
(1994)
4th (edn.); Cincinnati, O.H
-
-
-
26
-
-
41849105354
-
-
Triangle Park, NC, accessible via internet
-
USEPA, (1990) USEPA Compendium Chapter IP-9, Triangle Park, NC, accessible via internet: http://www.epa.gov.
-
(1990)
USEPA Compendium Chapter IP-9
-
-
-
27
-
-
41849130596
-
-
SIA, accessible via internet
-
ITRS, (2006) International Technology Roadmap for Semiconductors, SIA, accessible via internet: http://public.itrs.net.
-
(2006)
-
-
-
28
-
-
0037332399
-
Sources of sampling error for field measurement of nitric acid gas by a denuder system
-
Bai, H., Lu, C., Chang, K.F., and Fang, G.C. (2003) Sources of sampling error for field measurement of nitric acid gas by a denuder system. Atmos. Environ., 37: 941.
-
(2003)
Atmos. Environ
, vol.37
, pp. 941
-
-
Bai, H.1
Lu, C.2
Chang, K.F.3
Fang, G.C.4
-
29
-
-
0034202064
-
A fabric denuder for sampling semi-volatile species
-
Fitz, D.R. and Motallebi, N. (2000) A fabric denuder for sampling semi-volatile species. J. Air & Waste Manage. Assoc., 50: 981.
-
(2000)
J. Air & Waste Manage. Assoc
, vol.50
, pp. 981
-
-
Fitz, D.R.1
Motallebi, N.2
-
30
-
-
0004119084
-
-
2nd edn, John Wiley & Sons: New York
-
Hinds, W.C. (1998) Aerosol Technology, 2nd edn.; John Wiley & Sons: New York.
-
(1998)
Aerosol Technology
-
-
Hinds, W.C.1
-
31
-
-
0032880872
-
Optimization of the coating layer for the measurement of ammonia by diffusion denuders
-
Perrino, C. and Gherardi, M. (1999) Optimization of the coating layer for the measurement of ammonia by diffusion denuders. Atmos. Environ., 33 (28): 4579.
-
(1999)
Atmos. Environ
, vol.33
, Issue.28
, pp. 4579
-
-
Perrino, C.1
Gherardi, M.2
|