Geometric and electronic structure of lanthanide orthophosphate nanoparticles determined with X-rays

Journal of Chemical Physics

Volumn 128, Issue 13, 2008, Pages

  Suljoti, E ^a   Nagasono, M ^a,d   Pietzsch, A ^a   Hickmann, K ^b   Trots, D M ^c   Haase, M ^b   Wurth, W ^a   Fohlisch A ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

^b UNIVERSITY OF OSNABRÜCK   (Germany)

^c DESY   (Germany)

^d RIKEN   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL SYMMETRY; CRYSTALLIZATION; ELECTRONIC STATES; ELECTRONIC STRUCTURE; RARE EARTH ELEMENTS; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS;

CRYSTALLIZATION STATES; LANTHANIDE IONS; NEAR EDGE X RAY ABSORPTION; ORTHOPHOSPHATE NANOPARTICLES;

NANOPARTICLES;

LANTHANIDE; NANOMATERIAL; PHOSPHATE;

ARTICLE; CHEMISTRY; CONFORMATION; ELECTRIC CONDUCTIVITY; METHODOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE; X RAY DIFFRACTION;

ELECTRIC CONDUCTIVITY; LANTHANOID SERIES ELEMENTS; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; PHOSPHATES; SURFACE PROPERTIES; X-RAY DIFFRACTION;

EID: 41849146406     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2876360     Document Type: Article

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