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Volumn 2, Issue , 2006, Pages 1271-1274

Investigation of the surface passivation of P+-Type SI emitters by PECVD silicon carbide films

Author keywords

[No Author keywords available]

Indexed keywords

BORON; PASSIVATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICON WAFERS; SURFACE PHENOMENA;

EID: 41749110010     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCPEC.2006.279645     Document Type: Conference Paper
Times cited : (4)

References (10)
  • 3
    • 41749099918 scopus 로고    scopus 로고
    • M.J. Kerr, Thesis, Australian National University, Australia, 2003, p. 152ff
    • M.J. Kerr, Thesis, Australian National University, Australia, 2003, p. 152ff
  • 7
    • 41749116127 scopus 로고    scopus 로고
    • R. Petres et al, this proceedings
    • R. Petres et al., this proceedings.
  • 10
    • 41749083039 scopus 로고    scopus 로고
    • PC-1D, Solar Cell Simulation Software, P.A. Basore, D.A. Clugston, University of New South Wales
    • PC-1D, Solar Cell Simulation Software, P.A. Basore, D.A. Clugston, University of New South Wales.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.