Prediction of yield in a multiproduct batch production environment

Quality Engineering

Volumn 14, Issue 1, 2001, Pages 153-159

  Joseph, V Roshan ^a   Adya, Harsha ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b AT and S India Limited   (India)

Author keywords

Bayesian estimation; Beta binomial distribution; Complexity parameters; Logistic regression; PCB; Process related defects; Product related defects

Indexed keywords

MAXIMUM LIKELIHOOD ESTIMATION; PARAMETER ESTIMATION; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT MANUFACTURE; PROBABILITY DISTRIBUTIONS; REGRESSION ANALYSIS;

BAYESIAN ESTIMATION; YIELD PREDICTION;

BATCH DATA PROCESSING;

EID: 0035438523     PISSN: 08982112     EISSN: None     Source Type: Journal    
DOI: 10.1081/QEN-100106894     Document Type: Article

References (6)

1. Lot sizing with random yields
2. Extra-binomial variation in logistic linear models