Magnetic strip patterns induced by focused ion beam irradiation

Journal of Applied Physics

Volumn 103, Issue 6, 2008, Pages

  Makarov, D ^a   Tibus, S ^a   Rettner, C T ^b   Thomson, T ^c   Terris, B D ^c   Schrefl, T ^d   Albrecht, M ^e  

^a UNIVERSITY OF KONSTANZ   (Germany)

^b IBM ALMADEN RESEARCH CENTER   (United States)

^c HITACHI AMERICA LTD   (United States)

^d UNIVERSITY OF SHEFFIELD   (United Kingdom)

^e CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT ALLOYS; FOCUSED ION BEAMS; ION BOMBARDMENT; KERR MAGNETOOPTICAL EFFECT; MAGNETIC DOMAINS; MULTILAYER FILMS; SATURATION MAGNETIZATION;

EXPOSURE DOSE; FOCUSED ION BEAM IRRADIATION; MAGNETIC STRIP PATTERNS; REVERSAL BEHAVIOR;

MAGNETIC FILMS;

EID: 41549140898     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2894587     Document Type: Article

References (18)

1. A. Moser, K. Takano, D. T. Margulies, M. Albrecht, Y. Sonobe, Y. Ikeda, S. Sun, and E. E. Fullerton, J. Phys. D JPAPBE 0022-3727 10.1088/0022-3727/35/ 19/201 35, R157 (2002).
2. Z. Z. Bandić, H. Xu, and T. R. Albrecht, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1534614 82, 145 (2003).
3. R. Sugita, O. Saito, T. Muranoi, M. Nikishawa, and M. Nagao, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1453356 91, 8694 (2002).
4. B. R. Baker, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1457448 91, 8691 (2002).
5. T. Ishida, K. Miyata, T. Hamada, and K. Tohma, IEEE Trans. Magn. IEMGAQ 0018-9464 10.1109/20.950995 37, 1875 (2001).
6. A. Saito, E. Yonezawa, Y. Takano, and T. Watanabe, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1456050 91, 8688 (2002).
7. C. Chappert, H. Bernas, J. Ferŕ, V. Kottler, J.-P. Jamet, Y. Chen, E. Cambril, T. Devolder, F. Rousseaux, V. Mathet, and H. Launois, Science SCIEAS 0036-8075 10.1126/science.280.5371.1919 280, 1919 (1998).
8. J. Fassbender, L. Bischoff, R. Mattheis, and P. Fischer, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2158967 99, 08G301 (2006).
9. M. Albrecht, C. T. Rettner, M. E. Best, and B. D. Terris, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1630153 83, 4363 (2003).
10. C. T. Rettner, S. Anders, J. E. E. Baglin, T. Thomson, and B. D. Terris, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1432108 80, 279 (2002).
11. B. D. Terris, L. Folks, D. Weller, J. E. E. Baglin, A. J. Kellock, H. Rothuizen, and P. Vettiger, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.124389 75, 403 (1999).
12. H. Bernas, J.-Ph. Attane, K.-H. Heinig, D. Halley, D. Ravelosona, A. Marty, P. Auric, C. Chappert, and Y. Samson, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.91.077203 91, 077203 (2003).
13. B. D. Terris, M. Albrecht, G. Hu, T. Thomson, and C. T. Rettner, IEEE Trans. Magn. IEMGAQ 0018-9464 10.1109/TMAG.2005.855264 41, 2822 (2005).
14. V. Parekh, D. Smith, Ch. E, J. Rantschler, S. Khizroev, and D. Litvinov, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2719018 101, 083904 (2007).
15. W. Scholz, J. Fidler, T. Schrefl, D. Suess, R. Dittrich, H. Forster, and V. Tsiantos, Comput. Mater. Sci. CMMSEM 0927-0256 10.1016/S0927-0256(03)00119-8 28, 366 (2003).
16. T. C. Ulbrich, D. Makarov, G. Hu, I. L. Guhr, D. Suess, T. Schrefl, and M. Albrecht, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.96.077202 96, 077202 (2006).
17. J. Lee, D. Suess, J. Fidler, Th. Schrefl, and K. H. Oh, J. Magn. Magn. Mater. JMMMDC 0304-8853 10.1016/j.jmmm.2007.04.019 319, 5 (2007).
18. T. Schrefl, J. Fidler, K. Kirk, and J. Chapman, J. Magn. Magn. Mater. JMMMDC 0304-8853 10.1016/S0304-8853(97)00156-X 175, 193 (1997).