Relationship between field-emission characteristics and defects measured by Raman scattering in carbon-nanotube cathodes treated by plasma and laser

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 26, Issue 2, 2008, Pages 760-763

  Kim, W S ^a   Oki, H ^a   Kinoshita, A ^a   Murakami, K ^a   Abo, S ^a   Wakaya, F ^a   Takai, M ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODES; CURRENT DENSITY; DEFECTS; RAMAN SCATTERING; SURFACE TREATMENT;

FIELD-EMISSION CURRENT DENSITY; LASER TREATMENT;

CARBON NANOTUBES;

EID: 41549114136     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2884853     Document Type: Article

References (15)

1. K. Yu, Z. Zhu, M. Xu, Q. Li, and W. Lu, Chem. Phys. Lett. 0009-2614 10.1016/S0009-2614(03)00541-4 373, 109 (2003).
2. Y. Kanazawa, T. Oyama, K. Murakami, and M. Takai, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.1667518 22, 1342 (2004).
3. W. J. Zhao, A. Sawada, and M. Takai, J. Jpn. Appl. Phys., Part 1 41, 4314 (2002).
4. W. Rochanachirapar, K. Murakami, S. Abo, F. Wakaya, M. Takai, A. Hosono, and S. Okuda, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.1884118 23, 765 (2005).
5. A. Sawada, M. Iriguchi, W. J. Zhao, C. Ochiai, and M. Takai, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.1527597 21, 362 (2003).
6. W. J. Yu, Y. S. Cho, G. S. Choi, D. J. Kim, Y. H. Song, and J. H. Lee, Diamond Relat. Mater. 0925-9635 10.1016/j.diamond.2003.10.077 13, 1017 (2004).
7. W. S. Kim, T. Honda, C. B. Oh, K. Murakami, S. Abo, F. Wakaya, and M. Takai, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.2464120 25, 566 (2007).
8. A. C. Ferrari, J. C. Meyer, V. Scardaci, C. Casiraghi, M. Lazzeri, F. Mauri, S. Piscanec, D. Jiang, K. S. Novoselov, S. Roth, and A. K. Geim, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.97.187401 97, 187401 (2006).
9. M. S. Dresselhaus, G. Dresselhaus, R. Saito, and A. Jorio, Phys. Rep. 0370-1573 10.1016/j.physrep.2004.10.006 409, 47 (2005).
10. A. M. Rao, E. Richter, S. Bandow, B. Chase, P. C. Eklund, K. A. Williams, S. Fang, K. R. Subbaswarmy, M. Menon, A. Thess, R. E. Smalley, G. Dresselhaus, and M. S. Dresselhaus, Science 0036-8075 10.1126/science.275.5297.187 275, 187 (1997).
11. W. S. Bacsa, D. Ugarte, A. Chatelain, and W. A. De Heer, Phys. Rev. B 0163-1829 10.1103/PhysRevB.50.15473 50, 15473 (1994).
12. M. A. Pimenta, G. Dresselhaus, M. S. Dresselhaus, L. G. Cancado, A. Jorio, and R. Saito, Phys. Chem. Chem. Phys. 1463-9076 10.1039/b613962k 9, 1276 (2007).
13. K. Ohsumi, T. Honda, W. S. Kim, C. B. Oh, K. Murakami, S. Abo, F. Wakaya, and M. Takai, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.2539729 25, 557 (2007).
14. J. D. Hwang, K. F. Chen, L. H. Chan, and Y. Y. Chang, Appl. Phys. Lett. 0003-6951 10.1063/1.2222337 89, 033103 (2006).
15. C. Y. Zhi, X. D. Bai, and E. G. Wang, Appl. Phys. Lett. 0003-6951 10.1063/1.1503175 81, 1690 (2002).