A weighted CUSUM chart for detecting patterned mean shifts

Journal of Quality Technology

Volumn 40, Issue 2, 2008, Pages 194-213

  Shu, Lianjie ^a,d   Jiang, Wei ^b,e   Tsui, Kwok Leung ^c,f  

^a UNIVERSITY OF MACAU   (Macao)

^b STEVENS INSTITUTE OF TECHNOLOGY   (United States)

^c GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^d Faculty of Business Administration

^e Department of Systems Engineering and Engineering Management ^*

^f School of Industrial and Systems Engineering

Author keywords

Automatic process control; Change point detection; EWMA; Statistical process control

Indexed keywords

INFORMATION ANALYSIS; STATISTICAL PROCESS CONTROL; SYSTEMS ANALYSIS;

CHANGE POINT DETECTION; PATTERNED MEAN SHIFTS;

CONTROL SYSTEMS;

EID: 41549101711     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2008.11917725     Document Type: Article

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