Multivariate control charts for monitoring autocorrelated processes

Journal of Quality Technology

Volumn 36, Issue 4, 2004, Pages 367-379

  Jiang, Wei ^a,b  

^a STEVENS INSTITUTE OF TECHNOLOGY   (United States)

^b Department of Systems Engineering ^*  (Spain)

Author keywords

Generalized Likelihood Ratio Test; Regression Adjusted Chart

Indexed keywords

FUNCTIONS; MONITORING; PROBLEM SOLVING; REGRESSION ANALYSIS; STATISTICAL PROCESS CONTROL; VECTORS;

AUTOCORRELATED PROCESSES; GENERALIZED LIKELIHOOD RATIO TEST (GLRT); SPECIAL CAUSE CHARTS (SCC);

MULTIVARIABLE CONTROL SYSTEMS;

EID: 6344287886     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2004.11980284     Document Type: Review

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