Growth, annealing and thermo-electrical properties of Cd1-xZnxS thin films for microbolometers

Journal of Crystal Growth

Volumn 310, Issue 7-9, 2008, Pages 1674-1678

  Stolyarova, S ^a   Weinstein, M ^a   Nemirovsky, Y ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

A1. AFM; A3. Thin films; B1. Sulfides; B2. Semiconducting cadmium compounds; B3. Microbolometer

Indexed keywords

GRAIN BOUNDARIES; NANOCRYSTALLINE MATERIALS; THERMAL EVAPORATION; THIN FILMS; VANADIUM COMPOUNDS;

MICROBOLOMETERS; SULFIDES;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 41449114787     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.11.042     Document Type: Article

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