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Volumn 2, Issue , 2003, Pages 1483-1486
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In-situ study of acoustomigration by scanning Acoustic Force Microscopy
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ACOUSTIC MICROSCOPES;
ACOUSTIC RESONATORS;
ACOUSTIC TRANSDUCERS;
ACOUSTIC WAVES;
ELECTRODES;
GRANULAR MATERIALS;
LITHIUM COMPOUNDS;
MICROSCOPIC EXAMINATION;
STRESS ANALYSIS;
SURFACE TOPOGRAPHY;
ACOUSTOMIGRATION;
METAL STRUCTURES;
SCANNING ACOUSTIC FORCE MICROSCOPY (SAFM);
SUBMICRON LATERAL RESOLUTION;
ACOUSTIC SURFACE WAVE DEVICES;
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EID: 4143066170
PISSN: 10510117
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (9)
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