Investigation of single surface acoustic wave sources

Electronics Letters

Volumn 36, Issue 22, 2000, Pages 1903-1904

  Hesjedal, T ^a   Behme, G ^b  

^a Stanford University   (United States)

^b PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; MICROSCOPIC EXAMINATION; SEMICONDUCTING GALLIUM ARSENIDE; TRANSDUCERS;

SCANNING ACOUSTIC FORCE MICROSCOPY; WAVELENGTH RESOLUTIONS;

ACOUSTIC WAVES;

EID: 0034294511     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20001311     Document Type: Article

References (6)

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2. GINTER, A., and SOLKNER, G.: 'Phase accurate optical probing of surface acoustic-wave devices', Appl. Phys. Lett., 1990, 56, pp. 2295-2297
3. ZOLOTOYABKO, E., JACOBSOHN, E., SHECHTMAN, D., KANTOR, B., and SALZMAN, J.: 'X-ray-diffraction study of surface-acoustic-wave device under acoustic excitation', J. Appl. Phys., 1993, 73, pp. 8647-8649
4. ROHRBECK, W., and CHILLA, E.: 'Detection of surface acoustic waves by scanning force microscopy', Phys. Status Solidi A, 1992, 131, pp. 69-71
5. HESJEDAL, T., CHILLA, E., and FRÖHLICH, H.J.: 'High resolution visualization of acoustic wave fields within surface acoustic wave devices', Appl. Phys. Lett., 1997, 70, pp. 1372-1374
6. BEHME, G., HESJEDAL, T., CHILLA, E., and FRÖHLICH, H.J.: 'Transverse surface acoustic wave detection by scanning acoustic force microscopy', Appl. Phys. Lett., 1998, 73, pp. 882-884