메뉴 건너뛰기




Volumn 71, Issue 1, 2005, Pages

Search for universal roughness distributions in a critical interface model

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL INTERFACE MODELS; FLUCTUATION PROPERTIES; LOWEST-ORDER MOMENTS; ROUGHNESS DISTRIBUTIONS;

EID: 41349117600     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.71.016134     Document Type: Article
Times cited : (9)

References (28)
  • 15
    • 33646980308 scopus 로고    scopus 로고
    • G. Durin and S. Zapperi, e-print cond-mat/0404512
    • G. Durin and S. Zapperi, e-print cond-mat/0404512.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.