Nearfield surface enhanced spectroscopy using targeted nanoparticle deposition

Applied Physics Letters

Volumn 92, Issue 12, 2008, Pages

  Anderson, Mark S ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; INFRARED SPECTROSCOPY; LITHOGRAPHY;

NEAR FIELD SPECTROSCOPY; PLASMONIC DEVICE STRUCTURES;

NANOPARTICLES;

EID: 41349115278     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2891085     Document Type: Article

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