Automatic determination of recrystallization parameters in metals by electron backscatter pattern line scans

Materials Characterization

Volumn 51, Issue 4, 2003, Pages 271-282

  Larsen, Axel W ^a   Juul Jensen, Dorte ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

EBSP; Line scans; LSGRAINS; Metals; Recrystallization

Indexed keywords

ANNEALING; BACKSCATTERING; COMPUTATION THEORY; DEFORMATION; GRAIN SIZE AND SHAPE; GROWTH (MATERIALS); INTERFACES (MATERIALS); MICROSTRUCTURE; STATISTICAL METHODS;

ELECTRON BACKSCATTER PATTERN (EBSP); LINE SCANS; LSGRAINS;

RECRYSTALLIZATION (METALLURGY);

EID: 1542715692     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2004.01.001     Document Type: Article

References (13)

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