AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors

Analytical and Bioanalytical Chemistry

Volumn 390, Issue 6, 2008, Pages 1455-1461

  Fian, A ^a   Haase, A ^a   Stadlober, B ^a   Jakopic, G ^a   Matsko, N B ^b   Grogger, W ^b   Leising, G ^c  

^a JOANNEUM RESEARCH   (Austria)

^b GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^c GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Ellipsometry; Gate dielectric; Organic thin film transistor; OTFT; Zirconia

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; GATE DIELECTRICS; LEAKAGE CURRENTS; NANOCOMPOSITES; PERMITTIVITY; REFRACTIVE INDEX; SURFACE TOPOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY; ZIRCONIA;

ORGANIC THIN FILM TRANSISTORS;

THIN FILM TRANSISTORS;

EID: 41149143517     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-007-1663-7     Document Type: Article

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