Effect of density and surface roughness on optical properties of silicon carbide optical components

Chinese Physics Letters

Volumn 25, Issue 3, 2008, Pages 1135-1137

  Liu, Gui Ling ^a,b   Huang, Zheng Ren ^a   Liu, Xue Jian ^a   Jiang, Dong Liang ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL PROPERTIES; REFLECTION; SILICON CARBIDE;

BULK ABSORPTION; BULK SURFACES; DIFFUSE REFLECTANCE; MAJOR FACTORS; OPTICAL COMPONENTS; SPECULAR REFLECTANCE; TOTAL REFLECTANCE;

SURFACE ROUGHNESS;

EID: 41149123455     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/25/3/089     Document Type: Article

References (10)

1. Khounsary A, Fernandez P, Assoufid L and Schwartz J 2002 Rev. Sci. Instrum. 73 1537
2. Johnson J S, Grobsky K and Bray D J 2002 Proc. SPIE. 4771 243
3. Ebizuka N, Dai Y, Eto H, Handa T, Takami H and Takahashi Y 2003 Proc. SPIE. 842 329
4. Zhang Y M, Zhang J H, Han J C, He X D and Yao W 2004 Mater. Lett. 58 1024
5. Brüggemann R, Reinig P and Hölling M 2003 Thin Solid Films 427 358
6. Dericioglu A F and Kagawa Y 2003 J. Eur. Ceram. Soc. 23 951
7. Lai F C, Li M, Wang H Q, Hu H L, Wang X P, Hou J G, Song Y Z and Jiang Y S 2005 Thin Solid Films 448 314
8. Guinneton F, Valmalette J C and Gavarri J R 2000 Opt. Mater. 15 111
9. Guinneton F, Sauques L, Valmalette J C, Cros F and Gavarri J R 2005 J. Phys. Chem. Solids 66 63
10. Koo W H, Lee S J, Lee S M, Jeong S M, Choi S H and Baik H K 2004 J. Vac. Sci. Technol. A 22 2048