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Volumn 24, Issue 1-3, 2008, Pages 35-44

Software and hardware techniques for SEU detection in IP processors

Author keywords

Fault injection; Hardware software techniques; Reliability; Single event upset faults

Indexed keywords

FAULT COVERAGE; FAULT INJECTION; SINGLE EVENT UPSET FAULTS;

EID: 40949123750     PISSN: 09238174     EISSN: 15730727     Source Type: Journal    
DOI: 10.1007/s10836-007-5028-0     Document Type: Article
Times cited : (11)

References (13)
  • 8
    • 0038721289 scopus 로고    scopus 로고
    • Basic mechanisms and modeling of single-event upset in digital microelectronics
    • 3
    • Dodd PE, Massengill LW (2003) Basic mechanisms and modeling of single-event upset in digital microelectronics. IEEE Trans Nucl Sci 50(3):583-602, June
    • (2003) IEEE Trans Nucl Sci , vol.50 , pp. 583-602
    • Dodd, P.E.1    Massengill, L.W.2
  • 12
    • 0036624508 scopus 로고    scopus 로고
    • Coping with SEUs/SETs in microprocessors by means of low-cost solutions: A comparative study
    • 3
    • Rebaudengo M, Sonza Reorda M, Violante M, Nicolescu B, Velazco R (2002) Coping with SEUs/SETs in microprocessors by means of low-cost solutions: a comparative study. IEEE Trans Nucl Sci (49)3:1491-1495, June
    • (2002) IEEE Trans Nucl Sci , vol.49 , pp. 1491-1495
    • Rebaudengo, M.1    Sonza Reorda, M.2    Violante, M.3    Nicolescu, B.4    Velazco, R.5
  • 13
    • 0029732557 scopus 로고    scopus 로고
    • Terrestrial cosmic rays and soft errors
    • Ziegler F et al (1996) Terrestrial cosmic rays and soft errors. IBM J Res Develop 40(1)
    • (1996) IBM J Res Develop , vol.40 , Issue.1
    • Ziegler, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.