Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites

Journal of Applied Physics

Volumn 103, Issue 5, 2008, Pages

  Wong, K M ^a   Chim, W K ^a   Huang, J Q ^a   Zhu, L ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CAPACITANCE; ELECTRON TRAPS; HOLE TRAPS; HYDROGEN;

HOLE TRAP SITES; NANODOTS;

NANOSTRUCTURES;

EID: 40849126902     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2875776     Document Type: Article

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