Energy-loss near-edge structure (ELNES) and first-principles calculation of electronic structure of nickel silicide systems

Ultramicroscopy

Volumn 108, Issue 5, 2008, Pages 399-406

  Kawasaki, Naohiko ^a   Sugiyama, Naoyuki ^a   Otsuka, Yuji ^a   Hashimoto, Hideki ^a   Tsujimoto, Masahiko ^b   Kurata, Hiroki ^b   Isoda, Seiji ^b  

^a TORAY RESEARCH CENTER INC   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

Electronic structure; ELNES; First principles calculation; Nickel silicide

Indexed keywords

ENERGY-LOSS NEAR-EDGE STRUCTURE (ELNES); FIRST-PRINCIPLES CALCULATION;

ELECTRONIC STRUCTURE; ENERGY DISSIPATION; GROUND STATE; SILICON COMPOUNDS;

NICKEL COMPOUNDS;

LEAD CHLORIDE; NICKEL; NICKEL SILICIDE; SILICON; TRANSITION ELEMENT; UNCLASSIFIED DRUG;

ARTICLE; CRYSTAL STRUCTURE; ELECTRONICS; FOURIER TRANSFORMATION; MATHEMATICAL ANALYSIS; MATHEMATICAL COMPUTING; TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 40749141469     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.05.012     Document Type: Article

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