Quantitative structured-illumination phase microscopy

Applied Optics

Volumn 47, Issue 1, 2008, Pages 15-24

  Pavani, Sri Rama Prasanna ^a   Libertun, Ariel R ^a   King, Sharon V ^a   Cogswell, Carol J ^a,b  

^a UCB 450   (United States)

^b CDM Optics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CHARGE COUPLED DEVICES; MICROSCOPES;

DIGITAL PROCESSING ALGORITHM; DISTORTED PATTERN; OPTICAL PATH LENGTH; PHASE IMAGING METHOD; PHASE MICROSCOPY;

IMAGE ANALYSIS;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; EVALUATION; ILLUMINATION; IMAGE ENHANCEMENT; IMAGE QUALITY; INSTRUMENTATION; METHODOLOGY; PHASE CONTRAST MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; LIGHTING; MICROSCOPY, PHASE-CONTRAST; PHANTOMS, IMAGING; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 40749132586     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.000015     Document Type: Article

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