Scanning transmission microscopy using a position-sensitive detector

Applied Optics

Volumn 45, Issue 33, 2006, Pages 8410-8418

  Ayres, Mark R ^a   McLeod, Robert R ^b  

^a InPhase Technologies Inc   (United States)

^b University of Colorado   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; COMPUTER SIMULATION; DETECTORS; SENSITIVITY ANALYSIS; TRANSFER FUNCTIONS; VOLUMETRIC ANALYSIS;

CONFOCAL MICROSCOPES; OBJECT RECONSTRUCTION; POSITION-SENSITIVE DETECTORS;

SCANNING ELECTRON MICROSCOPY;

ARTICLE; COMPUTER AIDED DESIGN; COMPUTER ASSISTED DIAGNOSIS; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; MOTION; PILOT STUDY; REPRODUCIBILITY; SCANNING TUNNELING MICROSCOPY; SENSITIVITY AND SPECIFICITY; TRANSDUCER;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY, SCANNING TUNNELING; MOTION; PILOT PROJECTS; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TRANSDUCERS;

EID: 33847050267     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.008410     Document Type: Article

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