Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique

Ultramicroscopy

Volumn 108, Issue 5, 2008, Pages 393-398

  Warot Fonrose, B ^a   Houdellier, F ^a   Hytch M J ^a   Calmels, L ^a   Serin, V ^a   Snoeck, E ^a  

^a CEMES CNRS   (France)

Author keywords

EELS; Electron diffraction; Magnetic materials; MDFF

Indexed keywords

DIFFRACTION PATTERNS; ELECTRON DIFFRACTION; MAGNETIC MATERIALS;

MAGNETIC SAMPLES;

IMAGING TECHNIQUES;

ARTICLE; CIRCULAR DICHROISM; DIFFRACTION; ELECTRON BEAM; ELECTRON DIFFRACTION; ENERGY; ENERGY SPECTRUM IMAGING; IMAGING SYSTEM; MATHEMATICAL COMPUTING; MEASUREMENT; SIGNAL NOISE RATIO; TECHNIQUE; X RAY;

EID: 40749127909     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.05.013     Document Type: Article

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