Intelligent approach to determining optimal burn-in time and cost for electronic products

International Journal of Quality and Reliability Management

Volumn 18, Issue 5, 2001, Pages 549-559

  Su, Chao Ton ^a   Wu, Cheng Lin ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Case study; Modelling; Neural networks

Indexed keywords

EID: 40749125914     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656710110392845     Document Type: Article

References (14)

1. Chou, K. and Tang, K. (1992), "Burn-in time and estimation of change-point with Weibull-exponential mixture distribution", Decision Sciences, Vol. 23, pp. 973-90.
2. Chien, K. and Kuo, W. (1996), "A nonparametric approach to estimate system burn-in time", IEEE Transactions on Semiconductor Manufacturing, Vol. 9 No. 3, pp. 461-7.
3. Chien, K. and Kuo, W. (1997), "A nonparametric Bayes approach to decide system burn-in time", Naval Research Logistics Quarterly.
4. Funahashi, K. (1989), "On the approximate realization of continuous mapping by neural network", Neural Networks, Vol. 2, pp. 183-92.
5. Jensen, F. and Petersen N.E. (1990), An Engineering Approach to the Design and Analysis of Burn-in Procedure, Wiley, Chichester.
6. Kuo, W., Chien, W.T.K. and Kim, T. (1998), Reliability, Yield and Stress Burn-in: a Unifield Approach for Microelectronics Systems Manufacturing and Software Development, Kluwer Academic Publishers, Dordrecht.
7. Koh, J.S., Kim, C.H., Park and Yum, B.J. (1995), "Determination of effective burn-in time for printed board assembly", Microelectron Reliability, Vol. 35 No. 6, pp. 893-902.
8. Mi, J. (1996), "Warranty policies and burn-in", Naval Research Logistics, Vol. 44, pp. 199-209.
9. Nguyen, D.G. and Murthy, D.N.P. (1982), "Optimal burn-in time to minimize cost for products sold under warranty", IIE Transactions, Vol. 14, pp. 167-74.
10. Plesser, K.T. and Field, T.O. (1977), "Cost-optimized burn-in duration for repairable electronic system", IEEE Transactions on Reliability, Vol. R-26 No. 3, pp. 195-7.
11. Rumelhart, D.E. and McClelland, J.L. (1989), "Parallel distributed processing: explorations in the microstructure of cognition", International Journal of Quality & Reliability, Vol. I, Study in switch mode rectifier, MIT Press, Cambridge, MA.
12. Stewart, L.T. and Johnson, J.D. (1972), "Determining optimum burn-in and replacement times using Bayesian decision theory", IEEE Transactions on Reliability, Vol. 21 No. 3, pp. 170-5.
13. Stern, H.S. (1996), "Neural networks in applied statistics (with discussion)", Technometrics, Vol. 38, pp. 205-20.
14. Yan, L. and English, J.R. (1997), "Economic cost modeling of environmental-stress-screening and burn-in", IEEE Transactions on Reliability, Vol. 46 No. 3, pp. 275-81.