A nonparametric Bayes approach to decide system burn-in time

Naval Research Logistics

Volumn 44, Issue 7, 1997, Pages 655-671

  Chien, Wei Ting Kary ^a   Kuo, Way ^a  

^a Texas AandM University   (United States)

Author keywords

Nonparametric Bayes; System burn in; The Dirichlet distribution

Indexed keywords

DEFECTS; EQUIPMENT TESTING; FAILURE (MECHANICAL); MATHEMATICAL MODELS; RELIABILITY; STANDARDS;

BURN IN TIME; DIRICHLET DISTRIBUTION; NONPARAMETRIC BAYES METHOD;

LOGISTICS;

EID: 0031257418     PISSN: 0894069X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1520-6750(199710)44:7<655::AID-NAV4>3.0.CO;2-B     Document Type: Article

References (28)

1. Barlow, R.E., Bartholomew, D.J., Bremner, J.M., and Brunk, H.D., Statistical Inference under Order Restrictions; The Theory and Application of Isotonic Regression, Wiley, New York, 1971.
2. Bellcore, Reliability Prediction Procedure for Electronic Equipment, Bellcore Technical Reference TR-NWT-000332, Issue 3, 1990.
3. Campbell, M., "Monitored Burn-In Improves VLSI IC Reliability," Computer Design, 143-146 (1985).
4. Chi, D.H., and Kuo, W., "Burn-In Optimization under Reliability and Capacity Restrictions," IEEE Transactions on Reliability, 38, 193-198 (1989).
5. Chien, W.T.K., and Kuo, W., "Optimal Burn-In Simulation on Highly Integrated Circuit Systems," IIE Transactions, 24, 33-43 (1992).
6. Chien, W.T.K., and Kuo, W., "Modeling and Maximizing Burn-in Effectiveness," IEEE Transactions on Reliability, 44, 19-25 (1995).
7. Chien, W.T.K., and Kuo, W., "A Nonparametric Approach to Estimate System Burn-In Time," IEEE Transactions on Semiconductor Manufacturing, 9, 461-467 (1996).
8. Chou, K., and Tang, K., "Burn-In Time and Estimation of Change-Point with Weibull-Exponential Mixture Distribution," Decision Sciences, 23, 973-990 (1992).
9. Denton, D.L., and Blythe, D.M., "The Impact of Burn-In on IC Reliability," The Journal of Environmental Sciences, Jan./Feb., 19-23 (1986).
10. Disch, D., "Bayesian Nonparametric Inference for Effective Doses in a Quantal-Response Experiment," Biometrics, 37, 713-722 (1981).
11. Giuntini, R.E., and Giuntini, M.E., "Simulating a Weibull Posterior Using Bayes Inference," in Annual Reliability and Maintainability Symposium, 49-55, 1993.
12. Grosh, D.L., A Primer of Reliability Theory, Wiley, New York, 1989.
13. Haim, M., and Porat, Z., "Bayes Reliability Modeling of a Multistate Consecutive K-out-of-n: F System," in Annual Reliability and Maintainability Symposium, 582-586, 1991.
14. Kaplan, S., Cunha, G.D.M., Dykes, A.A., and Shaver, D., "A Bayesian Methodology for Assessing Reliability During Product Development," in Annual Reliability and Maintainability Symposium, 205-209, 1990.
15. Kumar, S., and Tiwari, R.C., "Bayes Estimation of Reliability under a Random Environment Governed by a Dirichlet Prior," IEEE Transactions on Reliability, 38, 218-223 (1989).
16. Kuo, W., "Reliability Enhancement Through Optimal Burn-In," IEEE Transactions on Reliability, R-33, 145-156 (1984).
17. Kuo, W., "Considering Incompatibility in Evaluating Large-Scale Systems Reliability," IEEE Transactions on Reliability, 43, 659-660 (1994).
18. Kuo, W., and Kuo, Y., "Facing the Headaches of Early Failures: A State-of-the-Art Review of Burn-In Decisions," Proceedings of the IEEE, 71, 1257-1266 (1983).
19. Leemis, L.M., and Beneke, M., "Burn-In Models and Methods: A Review," IIE Transactions, 22, 174-180 (1990).
20. Lochner, R.H., "A Generalized Dirichlet Distribution in Bayesian Life Testing," Journal of the Royal Statistical Society, Series B, 37, 103-113 (1975).
21. Mazzuchi, T.A., and Singpurwalla, N.D., "A Bayesian Approach for Inference for Monotone Failure Rates," Statistics and Probability Letters, 37, 135-141 (1985).
22. Mazzuchi, T.A., and Soyer, R., "A Bayesian Attribute Reliability Growth Model," in Annual Reliability and Maintainability Symposium, 322-324, 1991.
23. MIL-STD-280A, "Definitions of Item Levels, Item Exchangibility, Modelsm and Related Terms," The Naval Publications and Forms Center, 5801 Tabor Avenue, Philadelphia, PA 19120, 1969.
24. MIL-STD-756B, "Reliability Modeling and Prediction," The Naval Publications and Forms Center, 5801 Tabor Avenue, Philadelphia, PA 19120, 1981.
25. MIL-STD-217E, "Reliability Prediction of Electronic Equipment," The Naval Publications and Forms Center, 5801 Tabor Avenue, Philadelphia, PA 19120, 1986.
26. Nguyen, D.G., and Murthy, D.N.P., "Optimal Burn-in Time to Minimize Cost for Products Sold under Warranty," IIE Transactions, 14, 167-174 (1982).
27. Tillman, F.A., Kuo, W., Hwang, C.L., and Grosh, D.L., "Bayesian Reliability and Availability," IEEE Transactions on Reliability, R-31, 362-372 (1982).
28. Whitbeck and Leemis, L.M., "Component vs. System Burn-in Techniques for Electronic Equipment," IEEE Transactions on Reliability, 38, 206-209 (1989).