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Volumn 516, Issue 12, 2008, Pages 3847-3854

Chemical vapor deposition of phase-rich WC thin films on silicon and carbon substrates

Author keywords

CVD; Electrocatalysts; Tungsten carbide (WC) films; XPS; XRD

Indexed keywords

ELECTROCATALYSTS; TUNGSTEN CARBIDE; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 40749087973     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.06.170     Document Type: Article
Times cited : (29)

References (51)
  • 35
    • 40749112463 scopus 로고
    • Peiser H.S., Rooksby H.P., and Wilson A.J.C. (Eds), Reinhold Publishing Corporation, New York, USA
    • In: Peiser H.S., Rooksby H.P., and Wilson A.J.C. (Eds). X-ray Diffraction by Polycrystalline Materials. 2nd ed (1960), Reinhold Publishing Corporation, New York, USA 725
    • (1960) X-ray Diffraction by Polycrystalline Materials. 2nd ed , pp. 725


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.