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Volumn 31, Issue 1, 2008, Pages 76-81

A random trimming approach for obtaining high-precision embedded resistors

Author keywords

Embedded passives; Embedded resistors; Numerical simulation; Random trimming; Trimming; Voids

Indexed keywords

COMPUTER SIMULATION; ELECTRIC RESISTANCE; RANDOM PROCESSES; TRIMMING; VOID FRACTION;

EID: 40549134680     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/TADVP.2007.908030     Document Type: Article
Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.