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Physica Status Solidi (A) Applied Research

Volumn 201, Issue 9, 2004, Pages 2076-2081

In-situ CdCl2-treated CdTe film surface analysis by X-ray photoelectron spectroscopy

(2) Krishna, K Vamsi a Dutta, V a

a INDIAN INSTITUTE OF TECHNOLOGY DELHI (India)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BINDING ENERGY; DEPOSITION; FERMI LEVEL; HEAT TREATMENT; OXIDATION; PHOTOEMISSION; PHOTOLUMINESCENCE; PYROLYSIS; RECRYSTALLIZATION (METALLURGY); SOLAR CELLS; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

CURRENT TRANSPORT; SPRAY PYROLYSIS TECHNIQUE; SURFACE OXIDATION; VALENCE-BAND;

CADMIUM COMPOUNDS;

EID: 4043154451 PISSN: 00318965 EISSN: None Source Type: Journal
DOI: 10.1002/pssa.200406833 Document Type: Article

Times cited : (1)

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