Compensator thickness verification using an a-Si EPID

Medical Physics

Volumn 31, Issue 8, 2004, Pages 2300-2312

  Menon, Geetha V ^a   Sloboda, Ron S ^b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b CROSS CANCER INSTITUTE   (Canada)

Author keywords

a Si EPID; Compensator QC; Scatter model; Transmission measurement

Indexed keywords

COMPUTERIZED TOMOGRAPHY; THICKNESS MEASUREMENT; TRANSMISSIONS; UNCERTAINTY ANALYSIS;

A-SI EPID; AMORPHOUS SILICON (A-SI); COMPENSATOR QC; ELECTRONIC PORTAL IMAGING DEVICES; MEASUREMENT UNCERTAINTY; SCATTER MODEL; THICKNESS DISTRIBUTIONS; TRANSMISSION MEASUREMENTS;

AMORPHOUS SILICON;

SILICON DIOXIDE; STEEL;

ACCURACY; ANALYTIC METHOD; ARTICLE; CALCULATION; CALIBRATION; COMPENSATOR; DOSIMETRY; ELECTRONIC PORTAL IMAGING DEVICE; IMAGING SYSTEM; MEASUREMENT; MODEL; PREDICTION; PRIORITY JOURNAL; QUALITY CONTROL; RADIATION BEAM; RADIATION DOSE; THICKNESS;

EID: 4043075129     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.1767694     Document Type: Article

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