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Volumn 201, Issue 9, 2004, Pages 2021-2028
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Defects in silicon plastically deformed at room temperature
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL DEFECTS;
DEFORMATION;
HIGH TEMPERATURE EFFECTS;
PLASTICITY;
POSITRONS;
PRESSURE EFFECTS;
STRESS ANALYSIS;
CORE STRUCTURE;
HIGH-TEMPERATURE DEFORMATIONS;
SCREW DISLOCATIONS;
VACANCY CLUSTERS;
SILICON;
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EID: 4043067953
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/pssa.200306819 Document Type: Article |
Times cited : (7)
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References (16)
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