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Volumn 201, Issue 9, 2004, Pages 2021-2028

Defects in silicon plastically deformed at room temperature

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DEFORMATION; HIGH TEMPERATURE EFFECTS; PLASTICITY; POSITRONS; PRESSURE EFFECTS; STRESS ANALYSIS;

EID: 4043067953     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.200306819     Document Type: Article
Times cited : (7)

References (16)
  • 1
    • 0001634915 scopus 로고    scopus 로고
    • edited by K. A. Jackson and W. Schröter (Wiley-VCH, Weinheim)
    • H. Alexander and H. Teichler, in: Handbook of semiconductor technology, edited by K. A. Jackson and W. Schröter, Vol. l (Wiley-VCH, Weinheim, 2000), pp. 291-376.
    • (2000) Handbook of Semiconductor Technology , vol.50 , pp. 291-376
    • Alexander, H.1    Teichler, H.2
  • 10
    • 4043096684 scopus 로고    scopus 로고
    • J. Rabier, to be published
    • J. Rabier, to be published.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.