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Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 64, Issue 2, 2001, Pages 217051-217056

Resonant x-ray scattering study of the antiferroelectric and ferrielectric phases in liquid crystal devices

(13) Matkin, L S a Watson, S J a Gleeson, H F a Pindak, R b Pitney, J b Johnson, P M c Huang, C C c Barois, P d Levelut, A M e Srajer, G f Pollmann, J f Goodby, J W a Hird, M a

a UNIVERSITY OF MANCHESTER (United Kingdom)

b LUCENT TECHNOLOGIES (United States)

c University of Minnesota (United States)

d CNRS (France)

e UNIVERSITÉ PARIS SACLAY (France)

f ARGONNE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROELECTRIC MATERIALS; ELECTRIC FIELD EFFECTS; PHASE TRANSITIONS; SELENIUM; SUBSTRATES;

FERRIELECTRIC PHASES;

NEMATIC LIQUID CRYSTALS;

EID: 4043065344 PISSN: 15393755 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevE.64.021705 Document Type: Article

Times cited : (55)

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