High-speed TFT LCD defect-detection system with genetic algorithm

Assembly Automation

Volumn 28, Issue 1, 2008, Pages 69-76

  Lin, Chern Sheng ^a   Liao, Yo Chang ^a   Lay, Yun Long ^b   Lee, Kun Chen ^a   Yeh, Mau Shiun ^c  

^a FENG CHIA UNIVERSITY   (Taiwan)

^b NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^c CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Automation; Inspection; Pattern recognition; Transistors

Indexed keywords

AUTOMATION; GENETIC ALGORITHMS; INSPECTION; OPTICAL FIBER FABRICATION; PATTERN RECOGNITION; THIN FILM TRANSISTORS;

MICRO-FABRICATION PROCESS; OPTICAL INSPECTION SYSTEM;

LIQUID CRYSTAL DISPLAYS;

EID: 40349088728     PISSN: 01445154     EISSN: None     Source Type: Journal    
DOI: 10.1108/01445150810849037     Document Type: Article

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