Dependence of annealing time on structural and morphological properties of Ca(Zr0.05Ti0.95)O3 thin films

Journal of Alloys and Compounds

Volumn 453, Issue 1-2, 2008, Pages 386-391

  Cavalcante, L S ^a   Simoes A Z ^b   Orlandi, M O ^a   Santos, M R M C ^c   Varela, J A ^b   Longo, E ^b  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^b SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^c FEDERAL UNIVERSITY OF PIAUÍ   (Brazil)

Author keywords

Atomic force microscopy; Crystallization; Diffusion; Growth mechanism

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCIUM COMPOUNDS; CRYSTALLIZATION; DIFFUSION; FILM THICKNESS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; SPIN COATING; SURFACE MORPHOLOGY; X RAY DIFFRACTION ANALYSIS;

FIELD EMISSION SCANNING ELECTRON MICROSCOPY (FEGSEM); GROWTH MECHANISMS; ORTHORHOMBIC STRUCTURES; OXYGEN ATMOSPHERES;

THIN FILMS;

EID: 40149102946     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2006.11.129     Document Type: Article

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