Correlations between AFM and SEM imaging of acid-etched tooth enamel

Ultrastructural Pathology

Volumn 32, Issue 1, 2008, Pages 1-4

  Vitkov, Ljubomir ^a,b   Kastner, Markus ^c   Kienberger, Ferry ^c,d   Hinterdorfer, Peter ^c   Schilcher, Kurt ^d   Grunert, Ingrid ^e   Dumfahrt, Herbert ^a   Krautgartner, Wolf Dietrich ^b  

^a INNSBRUCK MEDICAL UNIVERSITY   (Austria)

^b University of Linz ^*  (Austria)

^c Agilent Technologies Osterrreich GmbH   (Austria)

^d UNIVERSITY OF APPLIED SCIENCES UPPER AUSTRIA   (Austria)

^e UNIVERSITY OF SALZBURG   (Austria)

Author keywords

Artifacts; Enamel bond strength; Enamel roughness; Profilometry; Steepness

Indexed keywords

ANALYTICAL ERROR; ARTICLE; ARTIFACT; ATOMIC FORCE MICROSCOPY; CORRELATION ANALYSIS; DENTAL ACID ETCHING; ELECTRON MICROSCOPE; ENAMEL; ERROR; IMAGE ANALYSIS; PARAMETER; PRIORITY JOURNAL; SCANNING ELECTROCHEMICAL MICROSCOPY; STRENGTH;

ACID ETCHING, DENTAL; DENTAL BONDING; DENTAL ENAMEL; HUMANS; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; MOLAR, THIRD; SURFACE PROPERTIES;

EID: 40049109515     PISSN: 01913123     EISSN: 15210758     Source Type: Journal    
DOI: 10.1080/01913120701808065     Document Type: Article

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