Group-index birefringence and loss measurements in silicon-on-insulator photonic wire waveguides

Optical Engineering

Volumn 46, Issue 10, 2007, Pages

  Duchesne, David ^a   Cheben, Pavel ^b   Morandotti, Roberto ^a   Lamontagne, Boris ^b   Xu, Dan Xia ^b   Janz, Siegfried ^b   Christodoulides, Demetrios ^c  

^a INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^c UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

Birefringence; Dispersion; Effective index; Group index; Linear loss; Nanowire waveguides; Silicon on insulator

Indexed keywords

GROUP INDEX; LINEAR LOSS; NANOWIRE WAVEGUIDES;

BIREFRINGENCE; DISPERSIONS; FABRY-PEROT INTERFEROMETERS; SILICON ON INSULATOR TECHNOLOGY;

OPTICAL WAVEGUIDES;

EID: 39749191950     PISSN: 00913286     EISSN: 15602303     Source Type: Journal    
DOI: 10.1117/1.2793711     Document Type: Article

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