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Volumn , Issue , 2002, Pages 730-734

FACTOR: A hierarchical methodology for functional test generation and testability analysis

Author keywords

[No Author keywords available]

Indexed keywords

FUNCTIONAL CONSTRAINTS; FUNCTIONAL TEST GENERATION; HIERARCHICAL APPROACH; LARGE DESIGNS; MODULE UNDER TESTS; SUBMODULES; TEST GENERATIONS; TESTABILITY ANALYSIS;

EID: 39749180898     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2002.998380     Document Type: Conference Paper
Times cited : (23)

References (12)
  • 1
    • 0032310132 scopus 로고    scopus 로고
    • Hierarchical test access architecture for embedded cores in an integrated circuit
    • April
    • D. Bhattacharya, "Hierarchical Test Access Architecture for Embedded Cores in an Integrated Circuit,", Proc. 16th IEEE VLSI Test Symposium, April 1998, pp. 8-14.
    • (1998) Proc. 16th IEEE VLSI Test Symposium , pp. 8-14
    • Bhattacharya, D.1
  • 3
    • 0026971706 scopus 로고
    • Hierarchical test generation under intensive global functional constraints
    • June
    • J. Lee, and J. H. Patel, "Hierarchical Test Generation under Intensive Global Functional Constraints," Proc. 29th Design Automation Conference, June 1992, pp. 261-266.
    • (1992) Proc. 29th Design Automation Conference , pp. 261-266
    • Lee, J.1    Patel, J.H.2
  • 5
    • 0027555924 scopus 로고
    • Test sets and reject rates: All fault coverages are not created equal
    • March
    • P. C. Maxwell and R. C. Aitken, " Test Sets and Reject Rates: All Fault Coverages Are Not Created Equal," IEEE Design & Test of Computers, Vol. 10, Issue 1, March 1993, pp. 42-51.
    • (1993) IEEE Design & Test of Computers , vol.10 , Issue.1 , pp. 42-51
    • Maxwell, P.C.1    Aitken, R.C.2
  • 7
    • 17044365216 scopus 로고
    • Behavioral test generation using mixed integer non-linear programming
    • October
    • R. S. Ramachandini and D. E. Thomas, "Behavioral Test Generation using Mixed Integer Non-linear programming," Proc. International Test Conference, October 1994, pp. 958-967.
    • (1994) Proc. International Test Conference , pp. 958-967
    • Ramachandini, R.S.1    Thomas, D.E.2
  • 8
    • 0031384267 scopus 로고    scopus 로고
    • A novel functional test generation method for processors using commercial atpg
    • November
    • R. S. Tupuri and J. A. Abraham, "A Novel Functional Test Generation Method for Processors using Commercial ATPG," Proc. International Test Conference, November 1997, pp. 743-752.
    • (1997) Proc. International Test Conference , pp. 743-752
    • Tupuri, R.S.1    Abraham, J.A.2
  • 9
    • 0032681050 scopus 로고    scopus 로고
    • Test generation for gigahertz processors using an automatic functional constraint extractor
    • June
    • R. S. Tupuri, A. Krishnamachary and J. A. Abraham, "Test Generation for Gigahertz Processors using an Automatic Functional Constraint Extractor," Proc. 36th Design Automation Conference, June 1999, pp. 647-652.
    • (1999) Proc. 36th Design Automation Conference , pp. 647-652
    • Tupuri, R.S.1    Krishnamachary, A.2    Abraham, J.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.