Electrode structures in diode-type cadmium telluride detectors: Field emission scanning electron microscopy and energy-dispersive x-ray microanalysis

Applied Physics Letters

Volumn 92, Issue 7, 2008, Pages

  Okada, Kyoko ^a   Yasufuku, Hideyuki ^b,c   Yoshikawa, Hideki ^b   Sakurai, Yoshiharu ^a  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^c RICOH COMPANY LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE X RAY ANALYSIS; FIELD EMISSION; INTERFACES (MATERIALS); SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE;

CADMIUM TELLURIDE DETECTORS; COMPLICATED STRUCTURES;

SEMICONDUCTOR DETECTORS;

EID: 39749180589     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2825565     Document Type: Article

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