Stress dependence and poly-pitch scaling characteristics of (110) PMOS drive current

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2007, Pages 126-127

  Yang, B ^a   Nummy, K ^b   Waite, A ^a   Black, L ^a   Gossmann, H ^a   Yin, H ^b   Liu, Y ^b   Kim, B ^b   Narasimha, S ^b   Fisher, P ^a   Meer, H V ^a   Johnson, J ^b   Chidambarrao, D ^b   Kim, S D ^b   Sheraw, C ^b   Wehella gamage, D ^b   Holt, J ^b   Chen, X ^b   Park, D ^b   Sung, C Y ^b   Schepis, D ^b   Khare, M ^b   Luning, S ^a   Agnello, P ^b   more..

^a ADVANCED MICRO DEVICES   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DRIVE CURRENTS; STRESS DEPENDENCE; VLSI TECHNOLOGIES;

DRIVES;

EID: 39549108423     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIT.2007.4339753     Document Type: Conference Paper

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