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Volumn 2007, Issue , 2007, Pages 291-294

Analytical and compact modelling of the I-MOS (Impact Ionization MOS)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT SIMULATION; ELECTRIC INVERTERS; IMPACT IONIZATION;

EID: 39549107107     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2007.4430935     Document Type: Conference Paper
Times cited : (9)

References (10)
  • 1
    • 84914709711 scopus 로고    scopus 로고
    • http://www.itrs.net/Common/2005ITRS/Home2005.htm
  • 3
    • 12344288472 scopus 로고    scopus 로고
    • Impact Ionization MOS (I-MOS) - Part II: Experimental Results
    • January
    • K. Gopalakrishnan et al, "Impact Ionization MOS (I-MOS) - Part II: Experimental Results", IEEE Transactions on Electron Devices, Vol. 52, No 1, p77-84, January 2005.
    • (2005) IEEE Transactions on Electron Devices , vol.52 , Issue.1 , pp. 77-84
    • Gopalakrishnan, K.1
  • 4
    • 33947220040 scopus 로고    scopus 로고
    • A Novel CMOS Compatible L-Shaped Impact-Ionization MOS (LI-MOS) Transistor
    • E. Ton et al, "A Novel CMOS Compatible L-Shaped Impact-Ionization MOS (LI-MOS) Transistor", IEDM 2005, p. 971-974.
    • (2005) IEDM , pp. 971-974
    • Ton, E.1
  • 5
    • 33746589939 scopus 로고    scopus 로고
    • Static and Dynamic TCAD Analysis of IMOS Performance: From the Single Device to the Circuit
    • August
    • F. Mayer et al, "Static and Dynamic TCAD Analysis of IMOS Performance: From the Single Device to the Circuit ", IEEE TED, Vol. 53, Issue 8, p 1852-1857, August 2006.
    • (2006) IEEE TED , vol.53 , Issue.8 , pp. 1852-1857
    • Mayer, F.1
  • 6
    • 33847753444 scopus 로고    scopus 로고
    • 70-nm Impact-Ionization Metal-Oxide- Semiconductor (I-MOS) Devices Integrated with Tunneling Field-Effect Transistors (TFETs)
    • W.Y. Choi et al, "70-nm Impact-Ionization Metal-Oxide- Semiconductor (I-MOS) Devices Integrated with Tunneling Field-Effect Transistors (TFETs) ", IEDM 2005, p. 975-978.
    • (2005) IEDM , pp. 975-978
    • Choi, W.Y.1
  • 7
    • 0027847411 scopus 로고
    • Scaling Theory for Double Gate SOI MOSFET's
    • December
    • K. Suzuki et al, "Scaling Theory for Double Gate SOI MOSFET's ", IEEE TED, Vol. 40, Issue 12, p 2326-2329, December 1993.
    • (1993) IEEE TED , vol.40 , Issue.12 , pp. 2326-2329
    • Suzuki, K.1
  • 9
    • 84957890418 scopus 로고    scopus 로고
    • Co-integration of 2 mV/dec Subthreshold Slope Impact Ionization MOS (I-MOS) with CMOS
    • September
    • F. Mayer et al, "Co-integration of 2 mV/dec Subthreshold Slope Impact Ionization MOS (I-MOS) with CMOS", ESSDERC, September 2006, p3003-306.
    • (2006) ESSDERC , pp. 3003-3306
    • Mayer, F.1
  • 10
    • 0026923596 scopus 로고
    • A New Analytical Diode Model Including Tunneling and Avalanche Breakdown
    • September
    • O.A.M. Hurkx et al, "A New Analytical Diode Model Including Tunneling and Avalanche Breakdown",IEEE TED, Vol. 39, Issue 9, p 2090-2098, September 1992
    • (1992) IEEE TED , vol.39 , Issue.9 , pp. 2090-2098
    • Hurkx, O.A.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.