Common point defects in as-grown ZnO substrates studied by optical detection of magnetic resonance

Journal of Crystal Growth

Volumn 310, Issue 5, 2008, Pages 1006-1009

  Son, N T ^a   Ivanov, I G ^a   Kuznetsov, A ^b   Svensson, B G ^b   Zhao, Q X ^a   Willander, M ^a   Morishita, M N ^c   Ohshima, T ^c   Itoh, H ^c   Isoya, J ^d   Janzen E ^a   Yakimova, R ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

^b UNIVERSITY OF OSLO   (Norway)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

^d UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

A1. Characterization; A1. Point defects; B1. Zinc compounds; B2. Semiconducting II VI materials

Indexed keywords

CRYSTAL GROWTH; DEFECTS; ELECTRON IRRADIATION; PHOTOLUMINESCENCE; ZINC OXIDE;

OPTICAL DETECTION; SHALLOW DONOR CENTERS;

MAGNETIC RESONANCE;

EID: 39249083751     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.11.144     Document Type: Article

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