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Volumn 69, Issue 11, 2004, Pages

Defects produced in ZnO by 2.5-MeV electron irradiation at 4.2 K: Study by optical detection of electron paramagnetic resonance

Author keywords

[No Author keywords available]

Indexed keywords

ZINC OXIDE;

EID: 2142709436     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.115212     Document Type: Article
Times cited : (66)

References (24)
  • 17
    • 33744562927 scopus 로고    scopus 로고
    • edited by K.A. Jackson and W. SchröterWiley-VCH, Weinheim, Chap. 3
    • G.D. Watkins, in Handbook of Semiconductor Technology, edited by K.A. Jackson and W. Schröter (Wiley-VCH, Weinheim, 2000), Chap. 3, Vol. 1.
    • (2000) Handbook of Semiconductor Technology , vol.1
    • Watkins, G.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.