SCOPUS 정보 검색 플랫폼

Volumn 477, Issue 1-2, 2008, Pages 295-299

Scale dependent plastic deformation of nanomultilayers with competitive effects of interphase boundary and grain boundary

(5) Liu, M X a Ma, F a Huang, P a Zhang, J M b Xu, K W a

a XI'AN JIAOTONG UNIVERSITY (China)

b SHAANXI NORMAL UNIVERSITY (China)

Author keywords

Grain boundary; Indentation depth; Interface; Multilayer

Indexed keywords

ALUMINUM; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOINDENTATION; NICKEL; SCANNING ELECTRON MICROSCOPY; STIFFNESS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CONTINUOUS STIFFNESS METHOD (CSM); FIELD-EMISSION SCANNING ELECTRON MICROSCOPY; INTERPHASE BOUNDARY; MECHANICAL RESPONSE;

METALLIC FILMS;

ALUMINUM; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; METALLIC FILMS; NANOINDENTATION; NICKEL; SCANNING ELECTRON MICROSCOPY; STIFFNESS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 39149102131 PISSN: 09215093 EISSN: None Source Type: Journal
DOI: 10.1016/j.msea.2007.05.040 Document Type: Article

Times cited : (8)

References (14)

1
- 0000690741
- Amar J.G., and Family F. Phys. Rev. Lett. 64 (1990) 543-546
- (1990) Phys. Rev. Lett. , vol.64 , pp. 543-546
- Amar, J.G.¹ Family, F.²

2
- 0037039185
- Saha R., and Nix W.D. Acta Mater. 50 (2002) 23-38
- (2002) Acta Mater. , vol.50 , pp. 23-38
- Saha, R.¹ Nix, W.D.²

3
- 0035699007
- Saha R., and Nix W.D. Mater. Sci. Eng. A 319 (2001) 898-901
- (2001) Mater. Sci. Eng. A , vol.319 , pp. 898-901
- Saha, R.¹ Nix, W.D.²

4
- 33244484117
- Lilleodden E.T., and Nix W.D. Acta Mater. 54 (2006) 1583-1593
- (2006) Acta Mater. , vol.54 , pp. 1583-1593
- Lilleodden, E.T.¹ Nix, W.D.²

5
- 0242468495
- Choi Y., Vliet K.J.V., Li J., and Suresh S. J. Appl. Phys. 94 (2003) 6050-6058
- (2003) J. Appl. Phys. , vol.94 , pp. 6050-6058
- Choi, Y.¹ Vliet, K.J.V.² Li, J.³ Suresh, S.⁴

6
- 3442900204
- Shan Z.W., Stach E.A., Wiezorek J.M.K., Knapp J.A., Follstaedt D.M., and Mao S.X. Science 305 (2004) 654-657
- (2004) Science , vol.305 , pp. 654-657
- Shan, Z.W.¹ Stach, E.A.² Wiezorek, J.M.K.³ Knapp, J.A.⁴ Follstaedt, D.M.⁵ Mao, S.X.⁶

7
- 0038701606
- Chen M.W., Ma E., Hemker K.J., Sheng H.W., Wang Y.M., and Cheng X.M. Science 300 (2003) 1275-1277
- (2003) Science , vol.300 , pp. 1275-1277
- Chen, M.W.¹ Ma, E.² Hemker, K.J.³ Sheng, H.W.⁴ Wang, Y.M.⁵ Cheng, X.M.⁶

8
- 0031539720
- Marvina L.A., and Marvin V.B. Tech. Phys. 42 (1997) 49-53
- (1997) Tech. Phys. , vol.42 , pp. 49-53
- Marvina, L.A.¹ Marvin, V.B.²

9
- 0037175827
- Xu J.H., Yu L.H., Azuma Y., Fujimoto T., Umehara H., and Kojima I. Appl. Phys. Lett. 81 (2002) 4139-4141
- (2002) Appl. Phys. Lett. , vol.81 , pp. 4139-4141
- Xu, J.H.¹ Yu, L.H.² Azuma, Y.³ Fujimoto, T.⁴ Umehara, H.⁵ Kojima, I.⁶

10
- 35949040064
- Koehler J.S. Phys. Rev. B 2 (1970) 547-551
- (1970) Phys. Rev. B , vol.2 , pp. 547-551
- Koehler, J.S.¹

11
- 21544460243
- Chu X., and Barnett S.A. J. Appl. Phys. 77 (1995) 4403-4411
- (1995) J. Appl. Phys. , vol.77 , pp. 4403-4411
- Chu, X.¹ Barnett, S.A.²

12
- 0032482795
- Misra A., Verdier M., Lu Y.C., Kung H., Mitchell T.E., Nastasi M., and Embury J.D. Scripta Mater. 39 (1998) 555-560
- (1998) Scripta Mater. , vol.39 , pp. 555-560
- Misra, A.¹ Verdier, M.² Lu, Y.C.³ Kung, H.⁴ Mitchell, T.E.⁵ Nastasi, M.⁶ Embury, J.D.⁷

13
- 25444444698
- Misra A., Hirth J.P., and Hoagland R.G. Acta Mater. 53 (2005) 4817-4824
- (2005) Acta Mater. , vol.53 , pp. 4817-4824
- Misra, A.¹ Hirth, J.P.² Hoagland, R.G.³

14
- 0347759938
- Hoagland R.G., Kurtz R.J., and Henager C.H. Scripta Mater. 50 (2004) 775-779
- (2004) Scripta Mater. , vol.50 , pp. 775-779
- Hoagland, R.G.¹ Kurtz, R.J.² Henager, C.H.³

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