FEXT crosstalk cancellation for high-speed serial link design

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2006, Pages 405-408

  Sham, Kin Joe ^a   Ahmadi, Mahmoud Reza ^a   Bommalingaiahnapallya, Shubha ^a   Talbot, Gerry ^b   Harjani, Ramesh ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

^b AMD Boston Design Center   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA LINES; FAR END CROSSTALK (FEXT) CANCELLATION; SERIAL LINK TRANSMITTERS;

CIRCUIT SIMULATION; CMOS INTEGRATED CIRCUITS; CROSSTALK; JITTER; TRANSMITTERS;

TRANSCEIVERS;

EID: 39049170248     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2006.320971     Document Type: Conference Paper

References (11)

1. R. Farjad-Rad et.al, "CMOS high-speed I/Os present and future," ICCD, 2003, pp. 1627-1630.
2. B. Young, Digital Signal Integrity: Modeling and Simulation with Interconnects and Packages, Prentice Hall PTR, NJ, 2001.
3. B. Analui et.al., "Data-dependent jitter and crosstalk-induced bounded uncorrelated jitter in copper interconencts," MTT, 2004, pp. 1627-1630.
4. Jared L. Zerbe et.al., "A 2Gb/s/pin 4-PAM parallel bus interface with transmit crosstalk cancellation, equalzation,and integrating receivers," IEEE ISSCC, 2001, pp. 36-37.
5. W. Dally and J. Poulton, Digital Systems Engineering, Cambridge University Press, New York, NY, 1998.
6. http://www.hypertransport.org/, "The hypertransport consortium,".
7. http://www.pcisig.com/, "PCI-SIG,".
8. M-T Hsieh and G.E. Sobelman, "Accurate prediction of jitter tolerance in high-speed serial links," Proc. Int. SoC Design Conference, 2005.
9. J. Buckwalter and A. Haijimiri, "Cancellation of crosstalk-induced jitter," IEEE JSSC, vol. 41, no. 3, pp. 621-632, March 2006.
10. C. Svensson and G. H. Dermer, "Time domain modeling of lossy interconnects," IEEE Transactions on Advanced Packaging, vol. 24, pp. 191-196, May 2001.
11. B. Razavi, Design of Integrated Circuits for Optical Communications, McGraw-Hill, New York, NY, 2003.