A DEPFET based beam telescope with submicron precision capability

IEEE Transactions on Nuclear Science

Volumn 55, Issue 1, 2008, Pages 662-666

  Velthuis, J J ^a,b   Drasal Z ^c   Hanninger, G ^a   Kohrs, R ^a   Mathes, M ^a   Reuen, L ^a   Scheirich, D ^c   Andricek, L ^d   Pascual, I Carbonell ^e   Chen, X ^f   Dolezal Z ^c   Fischer, P ^g   Frey, A ^f   Fuster, J A ^e   Koch, M ^a   Kodys P ^c   Kvasnicka P ^c   Kruger H ^a   Llácer, C Lacasta ^e   Lodomez, P ^a   Moser, H G ^d   Peric, I ^g   Raspereza, A ^f   Richter, R ^d   Rummel, S ^d   Von Torne E ^a   Wermes, N ^a   more..

^a UNIVERSITY OF BONN   (Germany)

^b UNIVERSITY OF BRISTOL   (United Kingdom)

^c CHARLES UNIVERSITY   (Czech Republic)

^d MPI HALBLEITERLABOR   (Germany)

^e INSTITUTO DE FÍSICA CORPUSCULAR IFIC   (Spain)

^f MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

^g UNIVERSITY OF MANNHEIM   (Germany)

Author keywords

Active pixel sensor; DEPFET; International Linear Collider (ILC); Solid state detector; Vertex detector

Indexed keywords

PARTICLE BEAMS; PIXELS;

ACTIVE PIXEL SENSORS; INTERNATIONAL LINEAR COLLIDER (ILC); VERTEX DETECTORS;

MOSFET DEVICES;

EID: 39049159226     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.914031     Document Type: Conference Paper

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