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Volumn 565, Issue 1, 2006, Pages 172-177
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First test beam results on DEPFET pixels for the ILC
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Author keywords
Active pixel sensor; Beam test; DEPFET; International linear collider (ILC); Tracking; Vertex detector
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Indexed keywords
MICROPROCESSOR CHIPS;
RADIATION DETECTORS;
SENSORS;
SPURIOUS SIGNAL NOISE;
SUBSTRATES;
ACTIVE PIXEL SENSORS;
BEAM TEST;
DEPFET SENSORS;
INTERNATIONAL LINEAR COLLIDER (ILC);
VERTEX DETECTORS;
FIELD EFFECT TRANSISTORS;
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EID: 33747154979
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2006.05.073 Document Type: Article |
Times cited : (9)
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References (8)
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