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Volumn 565, Issue 1, 2006, Pages 172-177

First test beam results on DEPFET pixels for the ILC

Author keywords

Active pixel sensor; Beam test; DEPFET; International linear collider (ILC); Tracking; Vertex detector

Indexed keywords

MICROPROCESSOR CHIPS; RADIATION DETECTORS; SENSORS; SPURIOUS SIGNAL NOISE; SUBSTRATES;

EID: 33747154979     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.05.073     Document Type: Article
Times cited : (9)

References (8)
  • 1
    • 33747200834 scopus 로고    scopus 로고
    • T. Behnke, S. Bertolucci, R.-D. Heuer, R. Settles (Eds.), TESLA-Technical Design Report, Report DESY-01-011, Vol. IV, 2001.
  • 3
    • 33747174260 scopus 로고    scopus 로고
    • C. Sandow, et al., Nucl. Instr. and Meth. A (2005), submitted for publication.
  • 5
    • 33747177336 scopus 로고    scopus 로고
    • L. Andricek, et al., The MOS-type DEPFET pixel sensor for the ILC environment and radiation studies, Talk at the Pixel 2005 Conference, Bonn.
  • 6
    • 33747156139 scopus 로고    scopus 로고
    • M. Trimpl, et al., Nucl. Instr. and Meth. A (2005), submitted for publication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.